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Sparks of Artificial General Intelligence(AGI) in Semiconductor Material Science: Early Explorations into the Next Frontier of Generative AI-Assisted Electron Micrograph Analysis



"Artificial General Intelligence"arXiv:2409.12244v1 Announce Type: new Abstract: Characterizing materials with electron micrographs poses significant challenges for automated labeling due to the complex nature of nanomaterial structures.



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